Reliability Experiment
01
High Temperature Reverse Bias Test(HTRB)
| Testing Time(Plan) |
Testing Time(Plan) |
Sample QTY(PCS) |
| New product development |
1000 |
77*3 (According to AEC-Q101) |
| Annual test |
1000 |
77 |
| New material confirmation |
168 |
77 |
| Monthly reliability monitoring |
168 |
22 |
- Test Type:Environmental (temperature) electrical stress composite verification
- Test Purpose:Verify the reverse working ability of chip under high temperature
- Test reference standard: GB/T 4023、JESD22-A108
- Test Conditions: VR(VZ)=80%*VRMAX,TA=TJ±5℃
- Test equipment:High Temperature Reverse Bias Test system (HTRB system)
02
Intermittent Operating Life test
| Testing Time(Plan) |
Testing Cycles(cycle) |
Sample QTY(PCS) |
| New product development |
7500 |
77*3 (According to AEC-Q101) |
| New material confirmation |
1000 |
77 |
| Monthly reliability monitoring |
1000 |
22 |
| IQC (incoming quality control inspection) |
1000 |
10 |
- Test Type:Electrical stress testing
- Test Purpose:Verify the comprehensive performance of the product in intermittent operation
- Test reference standard: MIL-STD-75 is equivalent to AEC-Q101-Rev-D1
- Test Conditions: ΔTj≥100℃,2min ON/2mil OFF
- Test equipment:Intermittent operating life test system
| Testing Time(Plan) |
Testing Cycles(H) |
Sample QTY(PCS) |
| New product development |
1000 |
77*3 |
| New material confirmation |
168 |
77 |
| Monthly reliability monitoring |
168 |
22 |
|
IQC (incoming quality control inspection)
|
168 |
10 |
- Test Type:Electrical stress verification
- Test Purpose:Verify the comprehensive performance of product under rated current (power)
- Test reference standard: GB/T 4023/JESD 22-A-108
- Test Conditions:Add voltage and current to the tested sample, and the product is equal to Ptot.
- Test equipment:Diode Constant Current burn-in test system
| Testing Time(Plan) |
Testing Cycles (Times) |
Sample QTY(PCS) |
| New product development |
Positive and negative electrodes 5 times each |
30*1 (According to AEC-Q101) |
| Annual test |
Positive and negative electrodes 5 times each |
30 |
| New material confirmation |
Positive and negative electrodes 5 times each |
22 |
| Monthly reliability monitoring |
Positive and negative electrodes 5 times each |
22 |
- Test Type:Electrical stress verification
- Test Purpose:Verify the anti-static ability of the product chip
- Test reference standard:JESD22-A114-A (HBM);JESD22-A115-A(MM)
- Test Conditions:RH=30-60%,TA=10-35℃ According to specifications
- Test equipment:Electrostatic discharge generators
05
Peak Forward Surge Current Test
| Testing Time(Plan) |
Testing Cycles(mS) |
Testing Cycles(mS) |
| New product development |
8.3mS |
77 |
| Annual test |
8.3mS |
77 |
| New material confirmation |
8.3mS |
40 |
| Monthly reliability monitoring |
8.3mS |
40 |
- Test Type:Electrical stress verification
- Test Purpose:Verify the forward surge current capability of product
- Test reference standard: Internal specification testing (destructive)
- Test Conditions: T=8.3mS(Or specially formulated test waveforms and times)
- Test equipment:Surge Generator
06
High Temperature Storage Test
| Testing Time(Plan) |
Testing Cycles(H) |
Sample QTY(PCS) |
| New product development |
1000 |
77*3 (According to AEC-Q101) |
| Annual test |
1000 |
77 |
| New material confirmation |
168 |
77 |
| Monthly reliability monitoring |
168 |
22 |
- Test Type:Environmental Stress verification
- Test Purpose:Verify the product's storage capacity at high temperatures
- Test reference standard:GB/T 4937.6-2012 is equivalent to IEC 60749-6:2002
- Test Conditions: TA=TstgMax±5℃(150℃)
- Test equipment:Temperature Test Chambers
07
Low Temperature Storage Test
| Testing Time(Plan) |
Testing Cycles(H) |
Sample QTY(PCS) |
| New product development |
1000 |
77*3 (According to AEC-Q101) |
| Annual test |
1000 |
77 |
| New material confirmation |
168 |
77 |
| Monthly reliability monitoring |
168 |
22 |
- Test Type:Environmental Stress verificationx
- Test Purpose:Verify the product's storage capacity at low temperatures
- Test reference standard: MIL-STD-810F
- Test Conditions: TA=-55℃±5℃
- Test equipment: Low Temperature Test Chambers
08
Constant Temperature/Humidity Storage Test
| Testing Time(Plan) |
Testing Cycles(H) |
Sample QTY(PCS) |
| New product development |
1000 |
77*3 (According to AEC-Q101) |
| Annual test |
1000 |
77 |
| New material confirmation |
168 |
77 |
| Monthly reliability monitoring |
168 |
22 |
- Test Type:Environmental Stress verification
- Test Purpose:Verify the sealing and moisture resistance of the product plastic seal
- Test reference standard: JESD22-A101
- Test Conditions:Ta: 85±2℃,RH: 85±5%
- Test equipment:Programmable Constant Temperature and Humidity Chamber
09
Temperature Cycling Test
| Testing Time(Plan) |
Testing Cycles(H) |
Sample QTY(PCS) |
| New product development |
1000 |
77*3 (According to AEC-Q101) |
| Annual test |
1000 |
77 |
| New material confirmation |
1000 |
77 |
| Monthly reliability monitoring |
100 |
22 |
- Test Type:Environmental (temperature) stress verification
- Test Purpose:Verify the resistance of exposure to alternating extremes of high and low temperatures
- Test reference standard:JESD22-A104C 、AEC-Q101、GB/T2423.22
- Test Conditions:(air to air)Ta=-55℃ 30min-----+150℃30min (Conversion time 1 minute)
- Test equipment:BOYI Temperature Cycling Test Chambers
10
Solder Heat Resistance Test/ Solderability Test
| Testing Time(Plan) |
Testing Cycles(S) |
Sample QTY(PCS) |
| New product development |
10+2/0S /5±1S |
10*1 (According to AEC-Q101) |
| Annual test |
10+2/0S /5±1S |
22 |
| New material confirmation |
10+2/0S /5±1S |
22 |
| Monthly reliability monitoring |
10+2/0S /5±1S |
22 |
- Test Type:Environmental Stress verification/Solder property verification
- Test Purpose:Verify product resistance to welding thermal shock/tin loading
- Test reference standard:GB/T4937.20-2012 /JESD22-B102D
- Test Conditions:Liquid tin temperature:260℃±5℃,10+2/-0 S / TA=245℃±3℃,T=5±1S
- Test equipment: Electric Digital constant temperature tin melting Furnace
| Testing Time(Plan) |
Testing Cycles(S) |
Sample QTY(PCS) |
| New product development |
96 |
77*3 (According to AEC-Q101) |
| Annual test |
96 |
77 |
| New material confirmation |
96 |
77 |
| Monthly reliability monitoring |
96 |
22 |
- Test Type:Environmental Stress verification
- Test Purpose:Verify product packaging tightness and moisture resistance
- Test reference standard:JESD22-A108
- Test Conditions:Pressure:2.07kg/cm2,Temp:121℃,Humidity:100%
- Test equipment: PCT Pressure Cooker Test
"Intelligent manufacturing" quality: As one of the core elements of competitiveness, quality should cover the entire product life-cycle from the production and development of products, delivery to subsequent related services.